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An abbreviated version of Silhouettes test: a brief validated mild cognitive impairment screening tool
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- Journal:
- International Psychogeriatrics / Volume 31 / Issue 6 / June 2019
- Published online by Cambridge University Press:
- 19 December 2018, pp. 849-856
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Exploiting the in-situ Electrical X-ray Microscopy for Semiconductor Nano Devices Analysis by X-ray Nanoprobe Beamline at Taiwan Photon Source
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 430-431
- Print publication:
- August 2018
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Developing the XEOL and TR-XEOL at the X-ray Nanoprobe at Taiwan Photon Source
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 198-199
- Print publication:
- August 2018
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